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With Tag: X Ray Photoelectron Spectroscopy

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Room temperature ferromagnetism of Ni, (Ni, Li), (Ni, N)-doped ZnO thin films

Xiaosi Qi, Haian Song, Youwei Du, Zaixin Yang, Wei Zhong, Xiaojuan Ye, Meihua Xu, Changqing Jin, Chaktong Au
Science China-technological Sciences | 2010 | 10.1007/s11431-010-0038-7

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Nitrogen-doped transparent tin oxide thin films deposited by sputtering

Current Applied Physics | 2011 | 10.1016/j.cap.2011.03.081

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Blood interactions with plasticized poly(vinyl chloride): relevance of plasticizer selection

G D O Lowe, Hua Q Yin, Richard H West, Claudia Blass, J M Courtney, X B Zhao
Journal of Materials Science: Materials in Medicine

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STUDY OF V�O� BY X-RAY PHOTOELECTRON SPECTROSCOPY.

Physical Review B

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Synchrotron Radiation X-ray Diffraction and X-ray Photoelectron Spectroscopy Investigation on Si-based Structures for Sub-Micron Si-IC Applications

Z C Feng, Lichi Cheng, Chuwan Huang, Yinglang Wang, T R Yang
2006 | 10.1109/SMELEC.2006.380785

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The influences of surface treatment and gas annealing conditions on the inversion behaviors of the atomic-layer-deposition Al(2)O(3)/n-In(0.53)Ga(0.47)As metal-oxide-semiconductor capacitor

M K Hudait, H Q Nguyen, Edward Yi Chang, Y F Hsieh, Y C Lin, H D Trinh, P W Wu, Yuen Yee Wong, C C Yu, K L Lin, C T Chang
Applied Physics Letters | 2010 | 10.1063/1.3467813

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Interfacial characteristics of N-incorporated HfAlO high-k thin films

Seok Joo Doh, Ji Hyun Lee, N I Lee, Kyusung Jeong, Sun Ah Park, D H Ko, S K Kang, Y K Kim, Dae Won Moon, M H Cho
Applied Physics Letters | 2004 | 10.1063/1.1764595

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Surface density enhancement of gold in silica film under laser irradiation at 355nm

Philippe Jonnard, G Dufour, J T Donohue, J L Rullier, J P Morreeuw
Applied Physics Letters | 2004 | 10.1063/1.1777391

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Mn12-acetate film pattern generated by photolithography methods

D M Seo, Joel Lewis Means, Winfried Teizer, Kim R Dunbar, Keekyoung Kim, V Meenakshi, Hanhua Zhao
Applied Physics Letters | 2004 | 10.1063/1.1808492

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Study of ultrathin Al2O3/Si(001) interfaces by using scanning reflection electron microscopy and x-ray photoelectron spectroscopy

Noriyuki Miyata, Manisha Kundu, Masakazu Ichikawa
Applied Physics Letters | 2001 | 10.1063/1.1355294

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Insitu characterization of diamond nucleation and growth

Steven J Schmieg, David N Belton, Stephen J Harris, Anita M Weiner, Thomas A Perry
Applied Physics Letters | 1989 | 10.1063/1.100938

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Structural and electrical characteristics of thin erbium oxide gate dielectrics

Wen Wei Yeh, Sungju Hou, Tungming Pan, Chunlin Chen
Applied Physics Letters | 2006 | 10.1063/1.2399938

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Thermal stability and energy-band alignment of nitrogen-incorporated Zr O 2 films on Si(100)

Q Fang, G H Li, L D Zhang, L Q Zhu, Meiyun Liu, Gaohong He
Applied Physics Letters | 2006 | 10.1063/1.2209882

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Surface reactions driven by cluster impact: Oxidation of Si(111) by (O2)n+(n∼1600)

Journal of Chemical Physics | 1997 | 10.1063/1.473949

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Study of field emission, electrical transport, and their correlation of individual single CuO nanowires

Ningsheng Xu, Shaozhi Deng, Jun Chen, Pengrui Shao
Journal of Applied Physics | 2011 | 10.1063/1.3536478

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In situ ellipsometric characterization of SiNx films grown by laser ablation

E C Samano, R Machorro, G Soto, L Cotaaraiza
Journal of Applied Physics | 1998 | 10.1063/1.368778

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UV-curable waterborne polyurethane acrylate modified with octavinyl POSS for weatherable coating applications

Journal of Polymer Research | 2010 | 10.1007/s10965-010-9468-3

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Transport and x-ray photoelectron spectroscopy properties of (Ni1−xCux)Mn2O4 and Ni(Mn2−yCuy)O4

Koji Fukao, Naoki Watanabe, Hideo Nakayama, Fumio Munakata
Journal of Applied Physics | 2011 | 10.1063/1.3606575

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