Papers

With Tag: Dielectric Breakdown

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Field Tests and Performance of High-Speed 138-Kv Air-Blast Circuit Breaker

Philip Sporn, H E Strang
Transactions of The American Institute of Electrical Engineers | 1942 | 10.1109/T-AIEE.1942.5058421

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The Sphere Spark Gap

S W Farnsworth, C L Fortescue
Transactions of The American Institute of Electrical Engineers | 1913 | 10.1109/T-AIEE.1913.4765045

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The Basis for the Nondestructive Testing of Insulation

R F Field
Transactions of The American Institute of Electrical Engineers | 1941 | 10.1109/T-AIEE.1941.5058411

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A Study on Insulation Characteristics of Laminated Polypropylene Paper for an HTS Cable

H J Kim, J W Cho, H G Cheon, Jae Won Choi, S H Kim
IEEE Transactions on Applied Superconductivity | 2010 | 10.1109/TASC.2010.2044235

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Can TDDB continue to serve as reliability test method for advance gate dielectric?

2004 | 10.1109/ICICDT.2004.1309979

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A statistical investigation of dielectric breakdown of low-density polyethylene

Energy Procedia | 2004 | 10.1109/ICSD.2004.1350295

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Theoretical Analysis of Dielectric Modulated Drift Region for Si Power Devices

IEEE Electron Device Letters | 2015 | 10.1109/LED.2015.2400457

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Statistical Fluctuations in Low-Current Barrier Microdischarges

Vladimir Khudik, A Shvydky, Constantine E Theodosiou
IEEE Transactions on Plasma Science | 2007 | 10.1109/TPS.2007.896985

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Penetrating electron fluctuations associated with GEO spacecraft anomalies

Daniel C Wilkinson, J B Parkinson, Donald S Toomb, David P Love
IEEE Transactions on Plasma Science | 2000 | 10.1109/27.902234

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Bubbles and breakdown of liquid dielectrics

1998 | 10.1109/ELINSL.1998.694865

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New thin-film power MOSFETs with a buried oxide double step structure

IEEE Electron Device Letters | 2006 | 10.1109/LED.2006.872904

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Improved immunity to plasma damage in ultrathin nitrided oxides

IEEE Electron Device Letters | 2000

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Measurement of complex impedance at high AC voltages using waveforms

IEEE Transactions on Instrumentation and Measurement | 2004 | 10.1109/IMTC.2004.1351479

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